Tom,

I am traveling, but may be able to call in.

John

-----Original Message-----
From: Tom Newton [mailto:[log in to unmask]]
Sent: Thursday, March 09, 2006 11:22 AM
To: [log in to unmask]
Subject: [EM] D-54 Subcommittee Teleconference - Thursday, March 09, 2006

Colleagues:

Please plan to participate with our Subcommittee Co-Chairs, Jan Obrzut and
Robert Croswell in the D-54 Embedded Devices Test Methods Subcommittee
teleconference.

1. HiPot Test Method 2.5.7.2 strategy for publishing the final draft.
2. Prioritization of test methods development:
a) Reliability
b) TCC
c) Dielectric Withstanding Voltage / AC stress method
d) Dielectric thickness < 8 microns
e) Measurement needs beyond YR 2010
3. Updated and keep current the D54 web page

The specifics for this D-54 Subcommittee Teleconference:

Date: THURSDAY, March 9, 2006
Time: 3:00 - 4:00 pm CDT
Call-In #: 1-620-782-8200; PIN: 89542#

Thanks!

Tom Newton
------------------------------------------------------------
Mail was checked for spam by the Freeware Edition of No Spam Today!
The Freeware Edition is free for personal and non-commercial use.
You can remove this notice by purchasing a full license! To order or to find
out more please visit: http://www.no-spam-today.com