Colleagues:

Please plan to participate with your D-54 Subcommittee Co-Chairs, Jan
Obrzut of NIST and Robert Croswell of Motorola in an Embedded Devices
Test Methods teleconference on Thursday, March 8 (this is only two days
from today). 

The primary agenda items for this teleconference are: 
1) Approaching the data generation  differently than has been tried in
the past for Gage R&R verification of the TM 2.5.7.2, "Dielectric
Withstanding Voltage for Thin Dielectrics" and 
2) Discussing some data received on Temperature Coefficient of
Resistance (TCR), the topic of which was initiated at the D-54
Subcommittee meeting in Los Angeles on February 21, 2007. 

The specifics for this D-54 Subcommittee Teleconference:

Date: THURSDAY, MARCH 8, 2007
Time: 3:00 - 4:00 pm Central Standard Time
Call-In #: 1-620-782-8200; PIN: 89542# 

Thanks!

Tom Newton