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July 2005

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Subject:
From:
Tom Newton <[log in to unmask]>
Reply To:
D-50 Embedded Devices Committee Forum <[log in to unmask]>, Tom Newton <[log in to unmask]>
Date:
Fri, 29 Jul 2005 13:27:37 -0500
Content-Type:
multipart/mixed
Parts/Attachments:
D-52 Embedded Devices Test Methods Subcommittee

 

Co-Chairs:        

Jan Obrzut, NIST

Robert Croswell, Motorola

 

MINUTES - Teleconference on Thursday, July 14, 2005 at 4:00 - 5:00 pm
EDT

 

Telecon Participants:

John Andresakis, Oak Mitsui

David McGregor, E.I. du Pont de Nemours & Co.

G. Sidney Cox, E.I. du Pont de Nemours & Co.   

Nick Biunno, Sanmina-SCI

Greg Schroeder, Sanmina-SCI

Dave Corbett, DSCC

Two Other Gentlemen from DSCC

Jan Obrzut, NIST

Robert Croswell, Motorola

Tom Newton, IPC

 

The teleconference addressed the Draft 2 of the proposed Test Method
2.5.7.2.  

 

Please find the attached Compiled Comments on Draft 2 of TM 2.5.7.2 and,
through 

incorporation of the resolved comments during the 7-14-05
teleconference, a Draft 3 

of TM 2.5.7.2 was constructed and attached, as well. 

 

Note:  The two attachments will be inserted into the D-54 Subcommittee
Home Page 

in the 'Drafts' and 'Comments' sections on Monday, August 1.

 

Thomas D. Newton

Director PCB Programs, Standards and Technology

IPC - Association Connecting Electronics Industries

3000 Lakeside Drive; Suite 309-S

Bannockburn, IL 60015

Direct: 847-597-2849              Main: 847-615-7100

Fax: 847-615-7105

E-mail: [log in to unmask]   web: www.ipc.org

 



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