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January 2006

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Subject:
D-54 Subcommittee Teleconference - Thursday, January 19, 2006
From:
Tom Newton <[log in to unmask]>
Reply To:
D-50 Embedded Devices Committee Forum <[log in to unmask]>, Tom Newton <[log in to unmask]>
Date:
Wed, 18 Jan 2006 15:19:27 -0600
Content-Type:
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Colleagues:

Please plan to participate with our Subcommittee Co-Chairs, Jan Obrzut
and Robert Croswell in the D-54 Test Methods teleconference. 

AGENDA:

1. Preparation for the D-54 committee meeting in Anaheim (Tuesday, Feb.
7 at    1:30-5:00 PM).

2. HiPot Test Method  2.5.7.2  Strategy for publishing the final draft.
        Volunteers are urgently needed to experimentally generate some
verifying data. 

3. Prioritization of test method development
3a. Reliability 
3b. TCC
3c. Dielectric Withstanding Voltage / AC stress method
3d. Dielectric thickness < 8 microns
3e Measurement needs beyond 2010 (USMS)
4. Input for John Perry for the Standards Development CD (D-54
Subcommittee    update & possibly the D-50 General Committee update)
5. Updates needed to the D-54 Subcommittee Home Page.

The specifics for this teleconference:

Date: THURSDAY, JANUARY 19, 2006
Time: 3:00 - 4:00 pm CDT
Call-In #: 1-620-782-8200; PIN: 89542# 

Thanks!

Tom Newton

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