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Date: | Thu, 10 Nov 2005 09:29:50 -0500 |
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Unfortuantely I am out of town and cannot attend.
Regards
Tom Newton
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[EM] D-54 Subcommittee
Teleconference - Thursday, November
11/09/2005 09:54 10, 2005
AM
Please respond to
D-50 Embedded
Devices Committee
Forum
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Tom Newton
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Colleagues:
Please plan to participate with our Subcommittee Co-Chairs, Jan Obrzut
and Robert Croswell in the D-54 Test Methods teleconference.
AGENDA:
1) The TM 2.5.7.2 was discussed in Las Vegas on October 26 and except
for two items, highlighted in yellow in Draft 8 (attached and also
posted in the Drafts section of the D-54 Subcommittee Home Page), the
document is complete. The next action that needs to be taken with this
Test Method is to run a Gage R&R test with at least two separate sites
to verify its accuracy. The final action will then be to submit the
Test Method to the 7-11 Test Methods Subcommittee for their approval &
ultimate placement in the IPC-TM-650 Test Methods Manual.
2) Discuss thickness measurement information that was disclosed at
IPCWorks.
3) Set the agenda for the next D-54 teleconference on Thursday, December
8 where, among other items, we should again pick-up the dielectric
withstanding voltage test method.
The specifics for this teleconference:
Date: THURSDAY, NOVEMBER 10, 2005
Time: 3:00 - 4:00 pm CDT
Call-In #: 1-620-782-8200; PIN: 89542#
Thanks!
Tom Newton
[attachment "Test Method 2-5-7-2 Draft 8 - 10-26-05.doc" deleted by William
J Borland/AE/DuPont]
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