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November 2005

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Subject:
From:
William J Borland <[log in to unmask]>
Reply To:
D-50 Embedded Devices Committee Forum <[log in to unmask]>, William J Borland <[log in to unmask]>
Date:
Thu, 10 Nov 2005 09:29:50 -0500
Content-Type:
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text/plain (87 lines)
Unfortuantely I am out of town and cannot attend.

Regards



             Tom Newton
             <[log in to unmask]
             G>                                                         To
             Sent by:                  [log in to unmask]
             EmbeddedNet                                                cc
             <[log in to unmask]
             ORG>                                                  Subject
                                       [EM] D-54 Subcommittee
                                       Teleconference - Thursday, November
             11/09/2005 09:54          10, 2005
             AM


             Please respond to
               D-50 Embedded
             Devices Committee
                   Forum
             <[log in to unmask]
               ORG>; Please
                respond to
                Tom Newton
             <[log in to unmask]
                    G>






Colleagues:

Please plan to participate with our Subcommittee Co-Chairs, Jan Obrzut
and Robert Croswell in the D-54 Test Methods teleconference.

AGENDA:

1) The TM 2.5.7.2 was discussed in Las Vegas on October 26 and except
for two items, highlighted in yellow in Draft 8 (attached and also
posted in the Drafts section of the D-54 Subcommittee Home Page), the
document is complete.  The next action that needs to be taken with this
Test Method is to run a Gage R&R test with at least two separate sites
to verify its accuracy.  The final action will then be to submit the
Test Method to the 7-11 Test Methods Subcommittee for their approval &
ultimate placement in the IPC-TM-650 Test Methods Manual.

2) Discuss thickness measurement information that was disclosed at
IPCWorks.

3) Set the agenda for the next D-54 teleconference on Thursday, December
8 where, among other items, we should again pick-up the dielectric
withstanding voltage test method.

The specifics for this teleconference:

Date: THURSDAY, NOVEMBER 10, 2005
Time: 3:00 - 4:00 pm CDT
Call-In #: 1-620-782-8200; PIN: 89542#

Thanks!

Tom Newton

[attachment "Test Method 2-5-7-2 Draft 8 - 10-26-05.doc" deleted by William
J Borland/AE/DuPont]

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